CVE-2024-45573

high

Description

Memory corruption may occour while generating test pattern due to negative indexing of display ID.

References

https://docs.qualcomm.com/product/publicresources/securitybulletin/february-2025-bulletin.html

Details

Source: Mitre, NVD

Published: 2025-02-03

Updated: 2025-02-05

Risk Information

CVSS v2

Base Score: 6.8

Vector: CVSS2#AV:L/AC:L/Au:S/C:C/I:C/A:C

Severity: Medium

CVSS v3

Base Score: 7.8

Vector: CVSS:3.0/AV:L/AC:L/PR:L/UI:N/S:U/C:H/I:H/A:H

Severity: High